Concepedia

Random error analysis of profile measurement of large aspheric optical surface using scanning deflectometry with rotation stage

Muzheng Xiao, Tomohiko Takamura, Satoru Takahashi, Kiyoshi Takamasu

Precision Engineering · 2013 · 11 citations · 3 references

DOI

Concepts

References

3

Nanometer profile measurement of large aspheric optical surface by scanning deflectometry with rotatable devices: Uncertainty propagation analysis and experiments

Muzheng Xiao, Satomi Jujo, Satoru Takahashi et al. · Precision Engineering · 2011 · 14 citations

, , +16

Analytical study of disturbing diffraction orders in in-line computer generated holograms for aspheric testing

Eugenio Garbusi, Wolfgang Osten · Optics Communications · 2010 · 10 citations

, , +10

Optics for the 20/20 telescope

Hubert M. Martin, J. R. P. Angel, James H. Burge et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2003 · 10 citations

, , +14