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Effects on surface morphology of epitaxial Y2O3 layers on Si (001) after postgrowth annealing

DOI

44

Citations

17

References

2004

Year

V. Ioannou-Sougleridis, Vassilios Constantoudis, Marin Alexe, Roland W. Scholz, G. Vellianitis, A. Dimoulas
Thin Solid Films

References

YearCitations

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