2002 · 37 citations · 9 references
EngineeringDesignManufacturing EngineeringDesign AutomationDesign For ManufacturingDesign ProcessLayout EvaluationVery-large-scale Integration LayoutAttributesManufacturabilityManufacturability-aware Design
A CAD manufacturability analysis environment, MAPEX, is described in this paper. It can be used to extract a large number of manufacturability/yield relevant design attributes from an IC layout. The extracted attributes can then be used to improve design tools/strategies or to analyze the reasons for observed yield loss.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
9