Publication | Closed Access
SCREAM I: A single mask, single-crystal silicon process for microelectromechanical structures
51
Citations
8
References
2002
Year
Unknown Venue
EngineeringProcess OutlineElectron-beam LithographyMicroelectromechanical StructuresMicroelectromechanical SystemsMicromanufacturingIntegrated CircuitsMicro-optical ComponentSilicon On InsulatorMicro-electromechanical SystemWafer Scale ProcessingBeam LithographyMaterials FabricationScream 1Microscale SystemNanolithography MethodMaterials ScienceMaterials EngineeringSingle MaskNanomanufacturingSingle-crystal Silicon ProcessMicroelectronicsMicrofabricationApplied PhysicsNanofabrication
A process outline for a one-mask version of the single-crystal silicon reactive etch and metal (SCREAM) process called SCREAM-I, for fabricating silicon microelectromechanical (MEM) devices, is presented. The process defines single-crystal silicon (SCS) high-aspect ratio beams using submicron optical lithography. The process defines MEM devices with a single mask, including contact pads, interconnects, released beams, and lateral capacitors. SCREAM 1 is a self-aligned, low-temperature (<300 degrees C) process that can be completed in approximately=6-8 hr. All fabrication steps rely on industry standard, high-throughput fabrication tools. Beam elements 0.5 mu m to 5 mu m in width can be fabricated with aspect ratios of greater than 10 to 1.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
| Year | Citations | |
|---|---|---|
Page 1
Page 1