NanoScale Quantitative Mechanical Property Mapping Using Peak Force Tapping Atomic Force Microscopy

S.C. Minne, Yaozeng Hu, Simon Hu, Bede Pittenger, Chunxia Su

Microscopy and Microanalysis · 2010 · 14 citations · 0 references

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.