Automatic mask alignment without a microscope

A.K. Kanjilal, Ram Narain, Rina Sharma, V.T. Chitnis, Brahm Pal Singh, Jingnan Liu, Junko Yamada, Yoshiaki Uchida

IEEE Transactions on Instrumentation and Measurement · 1995 · 18 citations · 3 references

Concepts

Abstract

A novel method for automatic mask alignment without using a microscope is reported. This method relies on the moire technique,

References

3