Proceedings - ACM IEEE Design Automation Conference · 2002 · 197 citations · 3 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsStochastic ProcessesUncertainty QuantificationDelay ModelingTiming AnalysisTiming ModelingJoint Probability Density FunctionsPath Delay AnalysisPath Delay ModelingProbabilistic AnalysisStatic Timing AnalysisTiming CharacterizationWorst-case Delay EstimationWorst-case Timing Analysis
The traditional approach to worst-case static-timing analysis is becoming unacceptably conservative due to an ever-increasing number of circuit and process effects. We propose a fundamentally different framework that aims to significantly improve the accuracy of timing predictions through fully probabilistic analysis of gate and path delays. We describe a bottom-up approach for the construction of joint probability density function of path delays, and present novel analytical and algorithmic methods for finding the full distribution of the maximum of a random path delay space with arbitrary path correlations.
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David Chinnery, Kurt Keutzer · 2005 · 87 citations
Engineering, Computer Engineering, Electrical Engineering +17
M.R.C.M. Berkelaar · TU/e Research Portal · 1997 · 18 citations