X-ray depth profiling of iron oxide thin films

Constitution of Binary Alloys

Max Hansen, K. Anderko, H. W. Salzberg · Journal of The Electrochemical Society · 1958 · 14.8K citations

Natural Sciences, Chemistry, Materials Science +8

X-ray total-external-reflection–Bragg diffraction: A structural study of the GaAs-Al interface

W. C. Marra, P. Eisenberger, A. Y. Cho · Journal of Applied Physics · 1979 · 586 citations

Natural Sciences, Materials Engineering, Materials Science +17

Grazing-incidence diffraction and the distorted-wave approximation for the study of surfaces

George H. Vineyard · Physical review. B, Condensed matter · 1982 · 518 citations

Natural Sciences, Materials Science, Physics +17

Model-Independent Structure Determination of the InSb(111)2×2 Surface with Use of Synchrotron X-Ray Diffraction

J. Bohr, R. Feidenhans’l, M. Nielsen et al. · Physical Review Letters · 1985 · 202 citations · Full text

Natural Sciences, Materials Science, Physics +17

Strain distribution in thin aluminum films using x-ray depth profiling

M. Doerner, S. Brennan · Journal of Applied Physics · 1988 · 139 citations

Natural Sciences, Materials Engineering, Materials Science +17