Publication | Closed Access
Update of single event failure in power MOSFETs
22
Citations
11
References
2002
Year
Unknown Venue
ReliabilityElectrical EngineeringReliability EngineeringGate RuptureEngineeringFailure DetectionHardware ReliabilitySoftware TestingComputer EngineeringFailure AnalysisCircuit ReliabilityPower ElectronicsPower MosfetsMicroelectronicsFailure ThresholdsSingle Event FailurePhysic Of FailureDevice Reliability
This paper presents an update of the first 1994 compendium of single event test data for power MOSFETs. It provides failure thresholds from burnout or gate rupture for 61 devices of six manufacturers.
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