Publication | Closed Access

Atomic resolution imaging and force versus distance measurements on KBr (0 0 1) using low temperature scanning force microscopy

Atomic Resolution ImagingEngineeringPhysicsMicroscopyMicroscopy MethodElectron MicroscopyScanning Probe MicroscopyApplied PhysicsScanning Force MicroscopyElectron MicroscopeForce MicroscopyInstrumentationMedicineBiophysicsMicrostructureLow Temperature