P. J. A. van Schendel

Quantitative Measurement of Short-Range Chemical Bonding Forces

Mark A. Lantz, Hans J. Hug, R. Hoffmann et al. · Science · 2001 · 417 citations

Atomic Force Microscopy, Engineering, Nanomaterials +12

Quantitative magnetic force microscopy on perpendicularly magnetized samples

Hans J. Hug, B. Stiefel, P. J. A. van Schendel et al. · Journal of Applied Physics · 1998 · 181 citations · Full text

Engineering, Microscopy, Magnetic Resonance +17

A method for the calibration of magnetic force microscopy tips

P. J. A. van Schendel, Hans J. Hug, B. Stiefel et al. · Journal of Applied Physics · 2000 · 131 citations

Engineering, Microscopy, Mechanical Engineering +17

A low temperature ultrahigh vaccum scanning force microscope

Hans J. Hug, B. Stiefel, P. J. A. van Schendel et al. · Review of Scientific Instruments · 1999 · 121 citations

Engineering, Microscopy, Magnetic Resonance +20

Operation characteristics of piezoelectric quartz tuning forks in high magnetic fields at liquid helium temperatures

Jörg Rychen, Thomas Ihn, P. Studerus et al. · Review of Scientific Instruments · 2000 · 78 citations · Full text