P. Kappenberger

Quantitative Measurement of Short-Range Chemical Bonding Forces

Mark A. Lantz, Hans J. Hug, R. Hoffmann et al. · Science · 2001 · 417 citations

Atomic Force Microscopy, Engineering, Nanomaterials +12

Atomic resolution imaging and frequency versus distance measurements on NiO(001) using low-temperature scanning force microscopy

R. Hoffmann, Mark A. Lantz, Hans J. Hug et al. · Physical review. B, Condensed matter · 2003 · 46 citations

Engineering, Microscopy, Force Microscopy +21

Exchange Bias and Domain Evolution at 10 nm Scales

I. Schmid, Miguel A. Marioni, P. Kappenberger et al. · Physical Review Letters · 2010 · 43 citations

Atomic resolution imaging and force versus distance measurements on KBr (0 0 1) using low temperature scanning force microscopy

R. Hoffmann, Mark A. Lantz, Hans J. Hug et al. · Applied Surface Science · 2002 · 40 citations

Atomic Resolution Imaging, Engineering, Physics +13

The role of uncompensated spins in exchange biasing

I. Schmid, P. Kappenberger, Olav Hellwig et al. · Europhysics Letters (EPL) · 2007 · 34 citations

Pinned Ucs, Engineering, Exchange Biasing +23