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Microwave noise performance of AlGaN-GaN HEMTs with small DC power dissipation
65
Citations
11
References
2002
Year
Wide-bandgap SemiconductorElectrical EngineeringEngineeringAlgan-gan HemtsDc Power DissipationRf SemiconductorElectronic EngineeringApplied PhysicsPower Semiconductor DeviceAluminum Gallium NitrideNoiseGan Power DeviceMicrowave Noise PerformancePower ElectronicsNoise PerformancePower Electronic DevicesDiscrete Algan-gan Hemts
We report low microwave noise performance of discrete AlGaN-GaN HEMTs at DC power dissipation comparable to that of GaAs-based low-noise FETs. At 1-V source-drain (SD) bias and DC power dissipation of 97 mW/mm, minimum noise figures (NF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">min</sub> ) of 0.75 dB at 10 GHz and 1.5 dB at 20 GHz were achieved, respectively. A device breakdown voltage of 40 V was observed. Both the low microwave noise performance at small DC power level and high breakdown voltage was obtained with a shorter SD spacing of 1.5 μm in 0.15-μm gate length GaN HEMTs. By comparison, NF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">min</sub> with 2 μm SD spacing was 0.2 dB greater at 10 GHz.
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