On the practical implementation of mixed analog-digital BIST

TLDR

Consumers increasingly demand higher value from electronic equipment. The study examines engineering and economic tradeoffs in implementing Mixed Analog‑Digital BIST for A/D converters to satisfy consumer demand for self‑test, diagnostics, and repair. Implementation addresses test overhead and performs frequency response, SNR, gain tracking, intermodulation, and harmonic distortion tests in a Mixed Analog‑Digital BIST for an A/D converter.

Abstract

Consumers are demanding more and more value for each dollar spent on new electronic equipment. Built-in Self-Test (BIST) of electronic circuits and equipment will help to satiate the demand for self test, self diagnostics, and self repair. This paper discusses some of the engineering and economical tradeoffs which must be addressed when implementing a Mixed Analog-Digital BIST (MADBIST) for an A/D converter on a mixed-signal IC. The overhead required to implement several types of tests is dealt with. The tests include frequency response, signal-to-noise ratio, gain tracking, intermodulation distortion, and harmonic distortion.