IEEE Journal of Solid-State Circuits · 1984 · 517 citations · 4 references
EngineeringElectrical EngineeringA/b TestingAnalog ElectronicsTest DevelopmentAnalog Integrated CircuitsConversion Rate AnalysisDc-dc ConversionDevice CharacterizationDigital Signal ProcessingNoise In Analog CircuitsA-d ConversionAnalog TestabilityAnalog-digital ConversionAnalog-to-digital ConversionAnalog-to-digital ConvertersConvertersFast Fourier TransformGain
Improved computer-aided analog-to-digital converter (ADC) characterization methods based on the code density test and spectral analysis using the fast Fourier transform are described. The code density test produces a histogram of the digital output codes of an ADC sampling a known input. The code density can be interpreted to compute the differential and integral nonlinearities, gain error, offset error, and internal noise. Conversion-rate and frequency-dependent behavior can also be measured.
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