Polarimetric wavelet phenomenology of space materials

Abstract

This paper describes new polarimetric wavelet detection principles applied to the backscattering characteristics of space materials in the near infrared. Efficient polarimetric detection techniques are combined with cross-correlation and wavelet analysis for enhanced characterization of space materials. The outcome of this study will support remote characterization of space materials and structures with enhanced discrimination, localization, and high-dynamic range while maintaining uncompromised sensitivity.