Processing and Characterization of Silica Xerogel Films for Low-K Dielectric Applications

Anurag Jain, Svetlana Rogojevic, Satya Nitta, V. Pisupatti, William N. Gill, Peter Wayner, Joel L. Plawsky, T. E. F. M. Standaert, G. S. Oehrlein

MRS Proceedings · 1999 · 14 citations · 26 references

Concepts

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