Impact of thermal stress on the characteristics of conducted emissions

Abstract

This work presents and discusses the results of a measurement campaign aimed at demonstrating the influence of aging on the spectrum produced by an electronic device. The evaluations evidence a high spectrum sensibility to the aging, which can be used for apparatus monitoring, but the electromagnetic signature, although modified, remains identifiable. The results presented refer to an extensive measurements campaign aimed at verifying the influence of thermal cycles, used to simulate the aging, on the spectral signature of a device, in order to evaluate its modification and to identify the device by signature.