Publication | Closed Access
Analysis and understanding of unique cryogenic phenomena in state-of-the-art SiGe HBTs
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Citations
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References
2006
Year
EngineeringPhysicsBias Temperature InstabilityCryogenicsApplied PhysicsSuperconductivityUnique Cryogenic PhenomenaSemiconductor Device FabricationSilicon On InsulatorState-of-the-art Sige Hbts
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