Parallel test generation for sequential circuits on general-purpose multiprocessors

Abstract

Article Free Access Share on Parallel test generation for sequential circuits on general-purpose multiprocessors Authors: Srinivas Patil IBM Corporation P.O. Box 950, Poughkeepsie, NY IBM Corporation P.O. Box 950, Poughkeepsie, NYView Profile , Prithviraj Banerjee Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, ILView Profile , Janak H. Patel Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, ILView Profile Authors Info & Claims DAC '91: Proceedings of the 28th ACM/IEEE Design Automation ConferenceJune 1991 Pages 155–159https://doi.org/10.1145/127601.127651Published:01 June 1991Publication History 27citation177DownloadsMetricsTotal Citations27Total Downloads177Last 12 Months8Last 6 weeks1 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteeReaderPDF