Thickness determination of uniform overlayers on rough substrates by angle-dependent XPS

Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range

Shigeo Tanuma, C. J. Powell, David R. Penn · Surface and Interface Analysis · 1994 · 2.7K citations · Full text

Engineering, Organic Chemistry, Computational Chemistry +20

Practical surface analysis by auger and X-ray photoelectron spectroscopy

P. Oelhafen · Journal of Electron Spectroscopy and Related Phenomena · 1984 · 2.5K citations

Materials Science, Surface Characterization, Engineering +6

Surface analysis and angular distributions in x-ray photoelectron spectroscopy

C. S. Fadley, R. J. Baird, W. J. Siekhaus et al. · Journal of Electron Spectroscopy and Related Phenomena · 1974 · 434 citations · Full text

Calculations of electron inelastic mean free paths (IMFPS). IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP‐2 for electron energies between 50 and 2000 eV

Shigeo Tanuma, C. J. Powell, David R. Penn · Surface and Interface Analysis · 1993 · 427 citations

Optical Materials, Imfp Results, Nuclear Physics +15

Monte Carlo modelling of electron-solid interactions

Ryōsuke Shimizu, Ding Zejun · Reports on Progress in Physics · 1992 · 365 citations

Engineering, Material Simulation, Electron Diffraction +17