W. J. Siekhaus

Changes in the Electronic Properties of Si Nanocrystals as a Function of Particle Size

T. van Buuren, L. N. Dinh, L. L. Chase et al. · Physical Review Letters · 1998 · 460 citations

Engineering, Colloidal Nanocrystals, Si Nanocrystals +17

Surface analysis and angular distributions in x-ray photoelectron spectroscopy

C. S. Fadley, R. J. Baird, W. J. Siekhaus et al. · Journal of Electron Spectroscopy and Related Phenomena · 1974 · 434 citations · Full text

Vapor pressure of Buckminsterfullerene

J. Abrefah, D.R. Olander, M. Balooch et al. · Applied Physics Letters · 1992 · 204 citations

Materials Science, High Temperature Materials, Engineering +15

Direct Observation of Native DNA Structures with the Scanning Tunneling Microscope

Thomas P. Beebe, Troy E. Wilson, D. Frank Ogletree et al. · Science · 1989 · 195 citations

Dna, Microscopy, Dna Analysis +18

Viscoelastic properties of demineralized human dentin measured in water with atomic force microscope (AFM)-based indentation

M. Balooch, I.-C. Wu-Magidi, Anna C. Balazs et al. · Journal of Biomedical Materials Research · 1998 · 188 citations