Concepedia

Substrate Overlayer Analysis

Substrate Overlayer Analysis is a methodological framework in X-Ray Photoelectron Spectroscopy that enables the quantitative assessment of layered materials by distinguishing between the underlying substrate and overlying film contributions to the photoelectron signal.

68

Publications

2.3K

Citations

220

Authors

93

Institutions

Publications per year

2017–2026

3

Parents

Publications

68

Application of ESCA to polymer chemistry. XVI. Electron mean free paths as a function of kinetic energy in polymeric films determined by means of ESCA

David Clark, H. R. Thomas · Journal of Polymer Science Polymer Chemistry Edition · 1977 · 172 citations

, , +14

X-ray photoelectron spectroscopy for the study of microbial cell surfaces

H.C. van der Mei, J. de Vries, H.J. Busscher · Surface Science Reports · 2000 · 135 citations

, , +14

Surface roughness effects in quantitative XPS: magic angle for determining overlayer thickness

P. L. J. Gunter, O.L.J. Gijzeman, J. W. Niemantsverdriet · Applied Surface Science · 1997 · 108 citations · Full text

, , +17

Infrared light scattering from surfaces covered with multiple dielectric overlayers

J. M. Elson · Applied Optics · 1977 · 78 citations

, , +17

Correction for the effects of adventitious carbon overlayers in quantitative XPS analysis

Stephen D. Evans · Surface and Interface Analysis · 1997 · 72 citations

, , +15

1–5 of 68

Authors

220

  1. JW
    J. W. Niemantsverdriet

    Eindhoven University of Technology, Netherlands

    3 publications · 174 citations

    3

    h-index

  2. PL
    P. L. J. Gunter

    Eindhoven University of Technology, Netherlands

    3 publications · 174 citations

    3

    h-index

  3. PP
    P. Pianetta

    Stanford Synchrotron Radiation Lightsource, United States

    2 publications · 22 citations

    2

    h-index

  4. TK
    T. Kendelewicz

    Stanford University, United States

    2 publications · 22 citations

    2

    h-index

  5. MM
    M. Mohai

    Hungarian Academy of Sciences, Hungary

    2 publications · 86 citations

    2

    h-index

1–5 of 220

Institutions

93

  1. Eindhoven University of Technology

    Eindhoven, The Netherlands

    3 h-index

    6 publications

    348 citations

  2. The University of Osaka

    Osaka, Japan

    2 h-index

    10 publications

    323 citations

  3. Princeton University

    Princeton, United States

    2 h-index

    8 publications

    228 citations

  4. National Institute of Standards and Technology

    Gaithersburg, United States

    2 h-index

    4 publications

    44 citations

  5. Hungarian Academy of Sciences

    Budapest, Hungary

    2 h-index

    4 publications

    210 citations

  6. Bilkent University

    Ankara, Türkiye

    2 h-index

    6 publications

    82 citations

  7. University of Münster

    Münster, Germany

    2 h-index

    7 publications

    168 citations

  8. Durham University

    Durham, United Kingdom

    2 h-index

    5 publications

    428 citations

1–8 of 93

Venues

  1. Applied Surface Science

    11 publications · 391 citations

    11

    h-index

  2. Surface Science

    8 publications · 252 citations

    8

    h-index

  3. Surface and Interface Analysis

    SIA · 8 publications · 356 citations

    8

    h-index

  4. 4

    h-index

  5. Japanese Journal of Applied Physics

    JJAP · 3 publications · 65 citations

    3

    h-index

1–5