2002 · 34 citations · 1 references
EngineeringComputer EngineeringMicroelectronicsRadiation MeasurementRadiation PhysicsHeavy-ion PhysicsHigh-dose Radiation EffectsIonization ProcessesRadiation SensitivityIonizing IrradiationRadiation EffectsRadiation Hardened Computer ArchitectureRadiation-hardened Integrated CircuitsRadiation-hardened MicroprocessorsSingle Event EffectsTotal DoseTotal Ionizing Dose Effects
To understand the radiation sensitivity and radiation response, Intel Pentium III and AMD K7 microprocessors were tested for total ionizing dose and single event effects. The processors have been found to be extremely tolerant to total ionizing dose and no radiation-induced latchups have been observed with protons or heavy ions to an LET of approximately 15 MeV-cm/sup 2//mg. Single event upset and functional interrupts have been observed for both protons and heavy ions.
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