High-Resolution Measurement of Resonant Wave Patterns by Perturbing the Evanescent Field Using a Nanosized Probe in a Transmission Scanning Near-Field Optical Microscopy Configuration

Abstract

<para xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> In order to model transmission scanning near-field optical microscopy (T-SNOM) experiments, we study the interaction between a nanosized atomic-force-microscopy-type probe and the optical field in a microcavity (MC) at or near resonance. Using a 2-D cross-sectional model of an experimentally studied photonic crystal MC, we have simulated the T-SNOM method by scanning a probe over the surface while monitoring the transmitted and reflected power. The simulations were performed for two probe materials: silicon and silicon nitride. From the probe-induced change in the transmission and reflection spectra, a wavelength shift was extracted. A shift almost proportional to the local field intensity was found if the resonator was excited just below a resonance wavelength. However, at the spots of highest interaction, we observed that besides the desired resonance wavelength shift, there was an increase in scattering. Furthermore, by moving the probe at such a spot in the vertical direction to a height of approximately 0.5 <formula formulatype="inline"><tex>$\mu\hbox{m}$</tex></formula>, a 5% increase in transmission can be established because the antiresonant condition is satisfied. Finally, a 2-D top view simulation is presented of the experimentally studied T-SNOM method, which shows a remarkably good correspondence in intensity profile, except for the exact location of the high-interaction spots. </para>