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High-Frequency Gate-All-Around Vertical InAs Nanowire MOSFETs on Si Substrates
83
Citations
8
References
2014
Year
Electrical EngineeringSi SubstrateEngineeringMetal Pad OverlapHigh-frequency DeviceNanoelectronicsElectronic EngineeringSi SubstratesApplied PhysicsSemiconductor Device FabricationIntegrated CircuitsAdditional PatterningSemiconductor Device
We demonstrate a vertical InAs nanowire MOSFET integrated on Si substrate with an extrinsic peak cut-off frequency of 103 GHz and a maximum oscillation frequency of 155 GHz. The transistor has a transconductance of 730 mS/mm and is based on arrays of nanowires with gate-all-around and high-κ gate dielectric. Furthermore, small-signal modeling shows a ~80% reduction of the total parasitic gate capacitance when the metal pad overlap in the transistors is reduced through additional patterning.
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