High-Frequency Gate-All-Around Vertical InAs Nanowire MOSFETs on Si Substrates

Sofia Johansson, Elvedin Memišević, Lars‐Erik Wernersson, Erik Lind

IEEE Electron Device Letters · 2014 · 83 citations · 8 references

Concepts

Abstract

We demonstrate a vertical InAs nanowire MOSFET integrated on Si substrate with an extrinsic peak cut-off frequency of 103 GHz and a maximum oscillation frequency of 155 GHz. The transistor has a transconductance of 730 mS/mm and is based on arrays of nanowires with gate-all-around and high-κ gate dielectric. Furthermore, small-signal modeling shows a ~80% reduction of the total parasitic gate capacitance when the metal pad overlap in the transistors is reduced through additional patterning.

References

8