Journal of Applied Physics · 1966 · 43 citations · 7 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsCrystal StructurePattern FormationCrystal LatticeCrystal SymmetryCrystallographyDiffractionElectron DiffractionElectron MicroscopyCrystal Lattice SymmetryCrystal Symmetry DeterminationDiffraction PatternsDiffraction SymmetryElectron CrystallographyReciprocal SpaceReciprocal Space MappingSpot Patterns
Composite Kikuchi electron diffraction patterns have been obtained which map out reciprocal space for silicon over the 〈001–011–111〉 stereographic triangle. These maps enable unknown diffraction patterns to be quickly solved even when they do not contain any Kikuchi poles. Unlike spot patterns, the Kikuchi patterns and maps uniquely represent the crystal symmetry. Some applications of these maps in crystallographic and electron microscopy investigations are discussed.
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Structure and Origin of Stacking Faults in Epitaxial Silicon
R. H. Finch, H. J. Queisser, G. Thomas et al. · Journal of Applied Physics · 1963 · 125 citations
Natural Sciences, Materials Engineering, Materials Science +17
Interstitial Ordering of Carbon in Tantalum
R. E. Villagrana, G. Thomas · physica status solidi (b) · 1965 · 68 citations · Full text