Optical characterization and selective addressing of the resonant modes of a micropillar cavity with a white light beam

Georgios Ctistis, Alex Hartsuiker, Edwin van der Pol, Julien Claudon, Willem L. Vos, Jean‐Michel Gérard

Physical Review B · 2010 · 26 citations · 31 references

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Abstract

We have performed white light reflectivity measurements on GaAs/AlAs micropillar cavities with diameters ranging from $1\text{ }\ensuremath{\mu}\text{m}$ up to $20\text{ }\ensuremath{\mu}\text{m}$. We are able to resolve the spatial field distribution of each cavity mode in real space by scanning a small-sized beam across the top facet of each micropillar. We spectrally resolve distinct transverse-optical cavity modes in reflectivity. Using this procedure we can selectively address a single mode in the multimode micropillar cavity. Calculations for the coupling efficiency of a small-diameter beam to each mode are in very good agreement with our reflectivity measurements.

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