Publication | Open Access
Influence of the device-width on the accuracy of quantization in the integer quantum Hall effect
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Citations
12
References
1995
Year
EngineeringMeasurementTopological Quantum StateQuantum EngineeringQuantum ComputingQuantum MaterialsQuantum EntanglementHall EffectQuantum SciencePhysicsQuantum DeviceQuantum AlgorithmSize EffectsQuantum SolidQuantized Hall ResistanceQuantum TechnologyNatural SciencesApplied PhysicsCondensed Matter PhysicsQuantum DevicesQuantum Error Correction
Using a cryogenic current comparator bridge, several Hall bar samples of different widths were compared to check whether size effects may deteriorate the accuracy of quantization in the integer quantum Hall effect. No width dependence of the quantized Hall resistance was observed in the range from 1 mm down to 10 /spl mu/m. The difference between the quantized Hall resistances of the i=2 and i=4 plateaus of the various samples was found to be smaller than the measurement uncertainty which is typically less than 1 part in 10/sup 9/.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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