Nanoscale · 2012 · 47 citations · 61 references
Natural SciencesMaterials EngineeringMaterials ScienceNanomaterialsNanotechnologySemiconductor MaterialsAtomic Force MicroscopyCarbon NanotubesConductive PolymersElectrical CharacterizationNanomaterial CharacterizationNanotubesCarbon Nanotube Electrical ConductivityConducting Polymer NanofibersConductive Atomic Force MicroscopyConductivity In PolymersElectrical PropertiesElectrical Properties AnalysisForce SpectroscopyNanofibers
The morphology and electrical properties of hybrids of a semiconducting polymer (namely poly(3-hexylthiophene) P3HT) and carbon nanotubes are investigated at the nanoscale with a combination of Scanning Probe Microscopy techniques, i.e., Conductive Atomic Force Microscopy (C-AFM) and time-resolved Current Sensing Force Spectroscopy Atomic Force Microscopy (CSFS-AFM, or PeakForce TUNA™). This allows us to probe the electrical properties of the 15 nm wide P3HT nanofibers as well as the interface between the polymer and single carbon nanotubes. This is achieved by applying controlled, low forces on the tip during imaging, which allows a direct comparison between the morphology and the electrical properties at the nanometre scale.
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