Publication | Closed Access
An intercomparison of measurement techniques for the determination of the dielectric properties of solids at near millimetre wavelengths
67
Citations
9
References
1994
Year
Optical MaterialsDielectricsEngineeringOptical TestingOptical MetrologyMeasurement TechniquesOptical CharacterizationSurface ReflectanceOptical PropertiesGuided-wave OpticInstrumentationReflectanceAbsorption CoefficientMaterials ScienceLength MetrologyOptical MeasurementMicrowave MeasurementRadiometryMicrowave DiagnosticsMillimeter Wave TechnologyElectrical PropertyRefractive IndexDielectric PropertiesMillimetre WavelengthsSpectroscopyApplied PhysicsTransparent Solid Specimens
The results of a measurement intercomparison aimed at assessing the systematic errors in near-millimetre-wavelength dielectric measurements on reasonably transparent solid specimens are presented and discussed. Various monochromatic, broad band, guided wave and free space measurement methods were intercompared in the frequency region from 30 to 900 GHz using round-robin measurements of the refractive index and absorption coefficient of seven specimens. Typically, systematic errors of up to 1% were found in the refractive index results, while very much larger systematic errors were found in the absorption results.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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