Solid-State Electronics · 1983 · 31 citations · 12 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDopingImpurity QuantificationSemiconductor DefectsSemiconductor Device MaterialsSemiconductor ReliabilitySilicon MaterialsImpurity StatesSilicon ContaminationSilicon Impurities
12
Deep impurities in semiconductors
J. Llacer · Journal of Crystal Growth · 1974 · 785 citations
Properties of Gold-Doped Silicon
C. B. Collins, R. O. Carlson, C. J. Gallagher · Physical Review · 1957 · 261 citations
A study of pendellösung fringes in X-ray diffraction
N. Kato, A. R. Lang · Acta Crystallographica · 1959 · 257 citations