Annealing Study of Erbium and Oxygen Implanted Gallium Nitride - Concepedia

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Annealing Study of Erbium and Oxygen Implanted Gallium Nitride

23

Citations

16

References

1996

Year

John T. Torvik, R. J. Feuerstein, C. H. Qiu, M. W. Leksono, J. I. Pánkové, F. Namavar

MRS Proceedings

Materials EngineeringMaterials ScienceEngineeringApplied PhysicsGallium OxideMicroelectronicsCategoryiii-v Semiconductor

References

	Year	Citations

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