Concepedia

Determination of growth rates of (100) and (110) faces of synthetic goethite by scanning force microscopy

Peter G. Weidler, Stephan J. Hug, T. P. Wetche, Tjisse Hiemstra

Geochimica et Cosmochimica Acta · 1998 · 71 citations · 21 references

DOI

Concepts

References

21

Atomic Force Microscope

G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.4K citations · Full text

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X-ray line broadening from filed aluminium and wolfram

G.K. Williamson, W H Hall · Acta Metallurgica · 1953 · 10.2K citations

, , +5

X-ray diffraction procedures

Harold P. Klug, Leroy Alexander · CERN Document Server (European Organization for Nuclear Research) · 1954 · 4.2K citations

The Rietveld method

R. A. Young · 1993 · 2.6K citations

, , +15

A Surface Structural Approach to Ion Adsorption: The Charge Distribution (CD) Model

Tjisse Hiemstra, W.H. van Riemsdijk · Journal of Colloid and Interface Science · 1996 · 1.1K citations

, , +16