IEEE Photonics Technology Letters · 2000 · 76 citations · 92 references
EngineeringElectrical EngineeringMicroelectronicsOptoelectronicsSemiconductor DevicesAvalanche ProcessesIonization ProcessesNoise In Electronic DevicesNoise In Semiconductor DevicesPhotodetectorsSemiconductor DetectorsAvalanche GainAvalanche MultiplicationAvalanche NoiseAvalanche Photodiode DetectorsAvalanche PhotodiodesElectron AvalancheElectron Impact IonizationPhotodiodes
We demonstrate an impact-ionization-engineered structure for the multiplication region of avalanche photodiodes. By enhancing the control of the impact-ionization position, the structure achieved high gain, low dark current, and very low noise.
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Thermal Agitation of Electric Charge in Conductors
H. Nyquist · Physical Review · 1928 · 3K citations
Thermal Agitation of Electricity in Conductors
J. B. Johnson · Physical Review · 1928 · 1.8K citations
Optical properties of Al<i>x</i>Ga1−<i>x</i> As
D. E. Aspnes, S. M. Kelso, R. A. Logan et al. · Journal of Applied Physics · 1986 · 879 citations
Natural Sciences, Materials Engineering, Materials Science +17