Silicon Carbide Die Attach Scheme for 500°C Operation

Thick film hybrid packaging techniques for 500°C operation

J.S. Salmon, Wayne Johnson, Michael J. Palmer · 2002 · 35 citations

Engineering, Electrical Engineering, Materials Science +17

600 C Logic Gates Using Silicon Carbide JFET's

Philip G. Neudeck, Glenn M. Beheim, Carl Salupo · NASA Technical Reports Server (NASA) · 2000 · 26 citations · Full text

Engineering, Aerospace Engineering, Electrical Engineering +17

Electrical characterization of annealed Ti/TiN/Pt contacts on N-type 6H-SiC epilayer

Robert S. Okojie, A.A. Ned, A. D. Kurtz et al. · IEEE Transactions on Electron Devices · 1999 · 12 citations

Engineering, Materials Engineering, Materials Science +17