A. D. Kurtz

Flash EEPROM Threshold Instabilities due to Charge Trapping During Program/Erase Cycling

Neal Mielke, Hanmant Belgal, I. Kalastirsky et al. · IEEE Transactions on Device and Materials Reliability · 2004 · 170 citations

Engineering, Computer Engineering, Electrical Engineering +17

Characterization of n-type beta -SiC as a piezoresistor

Joseph Shor, Daniel G. Goldstein, A. D. Kurtz · IEEE Transactions on Electron Devices · 1993 · 165 citations

Natural Sciences, Materials Engineering, Materials Science +16

Direct observation of porous SiC formed by anodization in HF

Joseph Shor, I. Grimberg, Ben-Zion Weiss et al. · Applied Physics Letters · 1993 · 162 citations

Natural Sciences, Materials Engineering, Materials Science +16

Effect of Dislocations on the Minority Carrier Lifetime in Semiconductors

A. D. Kurtz, S. A. Kulin, B. L. Averbach · Physical Review · 1956 · 150 citations

Engineering, Materials Engineering, Materials Science +17

Operation of α(6H)-SiC pressure sensor at 500 °C

Robert S. Okojie, Alexander A. Ned, A. D. Kurtz · Sensors and Actuators A Physical · 1998 · 111 citations

Engineering, Materials Engineering, Materials Science +12