IEEE Transactions on Nuclear Science · 2001 · 589 citations · 43 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsRadiation DetectionSemiconductor MaterialsGamma-ray DetectionGamma-ray DetectorsSemiconductor DetectorsSemiconductor Device MaterialsX-ray DetectionX-ray DetectorsCadmium Zinc TellurideCadmium Zinc Telluride DetectorsDetector Energy ResolutionDetectorsImaging DetectorsRadiation Energy ResolutionSemiconductor Gamma-ray DetectorsSemiconductor Radiation Detectors
Cadmium telluride (CdTe) and cadmium zinc telluride (CdZnTe) have been regarded as promising semiconductor materials for hard X-ray and /spl gamma/-ray detection. The high atomic number of the materials (Z/sub Cd/=48, Z/sub Te/=52) gives a high quantum efficiency in comparison with Si. The large bandgap energy (Eg/spl sim/1.5 eV) allows us to operate the detector at room temperature. However, a considerable amount of charge loss in these detectors produces a reduced energy resolution. This problem arises due to the low mobility and short lifetime of holes. Recently, significant improvements have been achieved to improve the spectral properties based on the advances in the production of crystals and in the design of electrodes. In this paper we summarize 1) advantages and disadvantages of CdTe and CdZnTe semiconductor detectors and 2) the technique for improving energy resolution and photopeak efficiencies. Applications of these imaging detectors in future hard X-ray and /spl gamma/-ray astronomy missions are briefly discussed.
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Properties of CdZnTe crystals grown by a high pressure Bridgman method
F. Patrick Doty, J.F. Butler, J. F. Schetzina et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1992 · 181 citations
Natural Sciences, Materials Engineering, Materials Science +16