Laser and Particle Beams · 2007 · 22 citations · 28 references
Natural SciencesPhysicsOpticsElectron Beam LithographyElectron MicroscopyLaser Material ProcessingLaser PhysicsLaser Surface ProcessingLaser-plasma InteractionsAblation Device DesignFocused Ion Beam LithographyFocused Ion Beam MachiningFocused Ion Beam PatterningFocused Ion Beam Scanning Electron MicroscopyLaser AblationLaser Ablation AnalysisLaser Surface Ablation
We propose the use of Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) devices for the analysis of ablation results. Ablated samples have been obtained by irradiating an Al planar target with an optically smoothed iodine laser working at 0.44 μm. The interpretation of FIB images shows the high potentiality of the technique.
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The Prague Asterix Laser System
K. Jungwirth, Andrea Cejnarová, L. Juha et al. · Physics of Plasmas · 2001 · 266 citations
Natural Sciences, Physics, Optics +16