Concepedia

Does The Esd-failure Current Obtained By Transmissionline Pulsing Always Correlate To Human Body Model Tests?

Wolfgang Stadler, X. Guggenmos, P. Egger, O. Gieser, C. Musshoff

1997 · 36 citations · 3 references

DOI

Concepts

References

3

ESD in silicon integrated circuits

Microelectronics Reliability · 1996 · 442 citations

, , +9

ESD in integrated circuits

A. Amerasekera, J.F. Verwey · Quality and Reliability Engineering International · 1992 · 43 citations

, , +15

Risetime effects of HBM and square pulses on the failure thresholds of GGNMOS-transistors

C. Musshoff, Heinrich Wolf, Horst Gieser et al. · Microelectronics Reliability · 1996 · 29 citations

, , +14