Concepedia

Characteristic-impedance measurement error on lossy substrates

Dylan F. Williams, Uwe Arz, H. Grabinski

IEEE Microwave and Wireless Components Letters · 2001 · 53 citations · 15 references

Concepts

EngineeringElectrical EngineeringInstrumentationMicroelectronicsSemiconductor DevicesDevice CharacterizationElectrical MeasurementCalibration ComparisonCharacteristic ImpedanceImpedance MeasurementInductance MeasurementParasitic EffectsParasitic Inductance EffectsSemiconductor Device CharacterizationSilicon

Abstract

This paper examines error caused by parasitic inductance in the characteristic impedance measured by the calibration comparison method on lossy silicon substrates.

References

15

A multiline method of network analyzer calibration

Roger B. Marks · IEEE Transactions on Microwave Theory and Techniques · 1991 · 1.3K citations · Full text

Engineering, Electrical Engineering, Metrology +14

A general waveguide circuit theory

Roger B. Marks, Dylan F. Williams · Journal of Research of the National Institute of Standards and Technology · 1992 · 411 citations · Full text

Engineering, Electrical Engineering, Physics +16

Characteristic impedance determination using propagation constant measurement

Roger B. Marks, Dylan F. Williams · IEEE Microwave and Guided Wave Letters · 1991 · 400 citations

Engineering, Electrical Engineering, Circuit Theory +16

High-speed VLSI interconnect modeling based on S-parameter measurements

Y. Eo, W.R. Eisenstadt · IEEE Transactions on Components Hybrids and Manufacturing Technology · 1993 · 286 citations

Engineering, Computer Engineering, Electrical Engineering +17

Comparison of On-Wafer Calibrations

Dylan F. Williams, Roger B. Marks, Andrew Davidson · 1991 · 224 citations

Engineering, Computer Engineering, Metrology +11