IEEE Transactions on Electron Devices · 2006 · 132 citations · 19 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsQuantum MechanicsSemiconductor DevicesDevice CharacterizationDevice ModelingDevice ScalingDevice SimulationSemiconductor PhysicsShort-channel EffectsDevice Scaling EffectsElectron Cross SectionsGate Oxide Thickness EffectsGate-dependent Current-voltage BehaviorSilicon-on-insulator TechnologyThreshold VoltageThreshold Voltage ModelingThreshold Voltage Scaling
A self-consistent Poisson-Schro/spl uml/dinger solver is used to calculate the current in trigate n-channel silicon-on-insulator transistors with sections down to 2 nm /spl times/ 2 nm. The minimum energy of the subbands and the threshold voltage increase as the cross-sectional area of the device is reduced and as the electron concentration in the channel is increased. As a consequence, the threshold voltage is higher than predicted by classical Poisson solvers. The current drive is diminished, and the subthreshold slope is degraded, especially in the devices with the smallest cross sections.
19
Jean-Pierre Colinge · Solid-State Electronics · 2004 · 936 citations
Physics of Semiconductor Devices
Materials Today · 2003 · 512 citations · Full text
High performance fully-depleted tri-gate CMOS transistors
B.S. Doyle, Suman Datta, M. Doczy et al. · IEEE Electron Device Letters · 2003 · 453 citations