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Damage to n-MOSFETs from electrical stress Relationship to processing damage and impact on device reliability

ReliabilityElectrical Stress RelationshipElectrical EngineeringReliability EngineeringEngineeringHardware ReliabilityBias Temperature InstabilityProcessing DamageCircuit ReliabilityElectronic PackagingDevice ReliabilityMicroelectronicsPhysic Of Failure