Development of embedded capacitor with bismuth-based pyrochlore thin films at low temperatures for printed circuit board applications

Jong Hyun Park, Cheng-Ji Xian, Nak‐Jin Seong, Soon‐Gil Yoon, SeungHyun Son, Hyung-Mi Chung, Jin-Suck Moon, Hyun-Joo Jin, Seung‐Eun Lee, Jeong‐Won Lee,

Microelectronics Reliability · 2007 · 12 citations · 3 references

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