Microelectronics Reliability · 2007 · 12 citations · 3 references
Natural SciencesElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsThin FilmsElectrode MaterialsThin Film Electrical PropertiesThin-film MaterialsBismuth Film ElectrodesFerroelectric CapacitorsLow-temperature Deposition
3
Jong Hyun Park, Cheng-Ji Xian, Nak‐Jin Seong et al. · Applied Physics Letters · 2006 · 45 citations
Natural Sciences, Materials Engineering, Materials Science +15