Journal of Crystal Growth · 1996 · 67 citations · 21 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsElectronic MaterialsSemiconductor MaterialsElectronic Band StructureOptical Properties Of SemiconductorsSemiconductor DefectsSemiconductor InterfacesSemiconductor PhysicsSemiconductor SurfacesAnti-phase BoundariesAntiphase BoundariesSemiconductor Crystallography
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H. Kroemer · Journal of Crystal Growth · 1987 · 506 citations
Material properties of high-quality GaAs epitaxial layers grown on Si substrates
R. Fischer, H. Morkoç̌, D. A. Neumann et al. · Journal of Applied Physics · 1986 · 270 citations