D. A. Neumann

Material properties of high-quality GaAs epitaxial layers grown on Si substrates

R. Fischer, H. Morkoç̌, D. A. Neumann et al. · Journal of Applied Physics · 1986 · 270 citations

Materials Engineering, Semiconductors, Materials Science +13

X-ray scattering studies of surface roughness of GaAs/A1As multilayers

S. K. Sinha, M. K. Sanyal, Sushil K. Satija et al. · Physica B Condensed Matter · 1994 · 89 citations

Surface Characterization, Engineering, Gaas/a1as Multilayers +3

X-ray refractive index: A tool to determine the average composition in multilayer structures

P. F. Miceli, D. A. Neumann, H. Zabel · Applied Physics Letters · 1986 · 88 citations

Optical Materials, Engineering, Crystal Growth Technology +23

X-ray evidence for a terraced GaAs/AlAs superlattice

D. A. Neumann, H. Zabel, H. Morkoç̌ · Applied Physics Letters · 1983 · 37 citations

Materials Science, Ii-vi Semiconductor, X-ray Spectroscopy +15

Structural properties of GaAs on (001) oriented Si and Ge substrates

D. A. Neumann, H. Zabel, R. Fischer et al. · Journal of Applied Physics · 1987 · 35 citations

Engineering, Semiconductor Device, Gaas Film +17