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X-ray evidence for a terraced GaAs/AlAs superlattice
37
Citations
8
References
1983
Year
Materials ScienceIi-vi SemiconductorX-ray SpectroscopyEngineeringPhysicsX-ray EvidenceOptical PropertiesX-ray DiffractionCondensed Matter PhysicsApplied PhysicsSuperconductivitySatellite ReflectionsX-ray Diffraction StudyGaas/alas SuperlatticeMolecular Beam EpitaxySynchrotron RadiationX-ray Free-electron LaserCrystallography
We report an x-ray diffraction study of a GaAs/AlAs superlattice, showing satellite reflections which lie on a line making a constant, nonzero angle with the [00L] reciprocal lattice rod containing the fundamental reflections. The results indicate a terraced superlattice structure in which the chemical modulation of the GaAs/AlAs layers is tilted with respect to the (001) lattice planes. This tilt imposes a reduced lateral domain size on the superlattice, which can be deduced from the angular widths of the satellite reflections.
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