Applied Optics · 1984 · 21 citations · 3 references
Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsSurface ScienceThin FilmsCoatingsOptical Properties Of SolidsOptical Thin FilmsSurface PhysicsThin Film Optical PropertiesX-ray OpticsAbsorber MaterialsMulti-layer CoatingsReflectivitySoft X-ray OpticsX-ray MirrorsX-ray Optics TestingX-ray ReflectionX-ray Reflectivity
The performance at soft x-ray wavelengths of multilayer mirrors fabricated with absorber layers of transition metals in the Ni to V series has been tested. Tests were performed at the Stanford Synchroton Radiation Laboratory, using a test chamber which allowed reflectivity measurements to be performed at angles from near-grazing to near-normal incidence. Useful reflectivity data were obtained at energies from 80 eV to the carbon edge (~250 eV). Some of the materials which were found to perform well at coarse 2d spacings were later tested in finer multilayers to evaluate the influence of interlayer surface roughness on reflectivity.
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Controlled fabrication of multilayer soft-x-ray mirrors
Eberhard Spiller, Armin Segmüller, J. C. Rife et al. · Applied Physics Letters · 1980 · 111 citations
Natural Sciences, Materials Engineering, Materials Science +15