Analog and digital single-event effects experiments in space

Abstract

Field-programmable gate arrays (FPGAs) and operational amplifiers are commonly used microelectronics in spaceflight instrumentation. In ground-based testing, these devices have been shown to experience single-event upset (SEU), the digital variety for the FPGA and the analog or transient type for the op-amps. Two experiment boards on the Microelectronics and Photonics Test Bed (MPTB) test these same parts in space. The data collected to date are presented here. The most interesting results are not from the primary focus of the SEU but from the total ionizing dose (TID) current monitoring of the FPGAs.