A microscope configuration for nanometer 3-D movement monitoring accuracy

Yevgeny Beiderman, Avigail D. Amsel, Yaniv Tzadka, Dror Fixler, Vicente Micó, Javier Garcı́a, Mina Teicher, Zeev Zalevsky

Micron · 2010 · 38 citations · 15 references

Concepts

References

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